Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide
K. Büchner, N. Ehrhardt, B. Cahill, C. Hoffmann, Thin Solid Films 519 (2011) 6480–6485.
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Artikel
| Veröffentlicht
| Englisch
Autor*in
Büchner, Kerstin;
Ehrhardt, Nadja;
Cahill, Brian
;
Hoffmann, Christian
;
Hoffmann, ChristianErscheinungsjahr
Zeitschriftentitel
Thin Solid Films
Band
519
Zeitschriftennummer
19
Seite
6480-6485
ISSN
FH-PUB-ID
Zitieren
Büchner, Kerstin ; Ehrhardt, Nadja ; Cahill, Brian ; Hoffmann, Christian: Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide. In: Thin Solid Films Bd. 519, Elsevier BV (2011), Nr. 19, S. 6480–6485
Büchner K, Ehrhardt N, Cahill B, Hoffmann C. Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide. Thin Solid Films. 2011;519(19):6480-6485. doi:10.1016/j.tsf.2011.04.215
Büchner, K., Ehrhardt, N., Cahill, B., & Hoffmann, C. (2011). Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide. Thin Solid Films, 519(19), 6480–6485. https://doi.org/10.1016/j.tsf.2011.04.215
@article{Büchner_Ehrhardt_Cahill_Hoffmann_2011, title={Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide}, volume={519}, DOI={10.1016/j.tsf.2011.04.215}, number={19}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Büchner, Kerstin and Ehrhardt, Nadja and Cahill, Brian and Hoffmann, Christian}, year={2011}, pages={6480–6485} }
Büchner, Kerstin, Nadja Ehrhardt, Brian Cahill, and Christian Hoffmann. “Internal Reflection Ellipsometry for Real-Time Monitoring of Polyelectrolyte Multilayer Growth onto Tantalum Pentoxide.” Thin Solid Films 519, no. 19 (2011): 6480–85. https://doi.org/10.1016/j.tsf.2011.04.215.
K. Büchner, N. Ehrhardt, B. Cahill, and C. Hoffmann, “Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide,” Thin Solid Films, vol. 519, no. 19, pp. 6480–6485, 2011.
Büchner, Kerstin, et al. “Internal Reflection Ellipsometry for Real-Time Monitoring of Polyelectrolyte Multilayer Growth onto Tantalum Pentoxide.” Thin Solid Films, vol. 519, no. 19, Elsevier BV, 2011, pp. 6480–85, doi:10.1016/j.tsf.2011.04.215.
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