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1 Publikation
2024 | Artikel | FH-PUB-ID: 4571 |
Wortmann, Martin, Klaus Viertel, Michael Westphal, Dominik Graulich, Yang Yang, Maik Gärner, Jan Schmalhorst, Natalie Frese, and Timo Kuschel. “Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.” Small Methods 8, no. 3 (2024). https://doi.org/10.1002/smtd.202300944.
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