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1 Publikation
2025 | Artikel | FH-PUB-ID: 6571
Wortmann M, Bednarz B, Nezafat NB, et al. Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. Applied Surface Science. 2025;713. doi:10.1016/j.apsusc.2025.164356
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