Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe
M. Wortmann, B. Bednarz, N.B. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst, I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten, T. Kuschel, Applied Surface Science 713 (2025).
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Artikel
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| Englisch
Autor*in
Wortmann, Martin;
Bednarz, Beatrice;
Nezafat, Negin Beryani;
Viertel, Klaus
;
Kuschel, Olga;
Schmalhorst, Jan;
Ennen, Inga;
Gärner, Maik;
Frese, Natalie;
Jakob, Gerhard;
Wollschläger, Joachim;
Schierning, Gabi
Alle
;
Kuschel, Olga;
Schmalhorst, Jan;
Ennen, Inga;
Gärner, Maik;
Frese, Natalie;
Jakob, Gerhard;
Wollschläger, Joachim;
Schierning, Gabi
Alle
Erscheinungsjahr
Zeitschriftentitel
Applied Surface Science
Band
713
Artikelnummer
164356
ISSN
FH-PUB-ID
Zitieren
Wortmann, Martin ; Bednarz, Beatrice ; Nezafat, Negin Beryani ; Viertel, Klaus ; Kuschel, Olga ; Schmalhorst, Jan ; Ennen, Inga ; Gärner, Maik ; u. a.: Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. In: Applied Surface Science Bd. 713, Elsevier BV (2025)
Wortmann M, Bednarz B, Nezafat NB, et al. Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. Applied Surface Science. 2025;713. doi:10.1016/j.apsusc.2025.164356
Wortmann, M., Bednarz, B., Nezafat, N. B., Viertel, K., Kuschel, O., Schmalhorst, J., … Kuschel, T. (2025). Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. Applied Surface Science, 713. https://doi.org/10.1016/j.apsusc.2025.164356
@article{Wortmann_Bednarz_Nezafat_Viertel_Kuschel_Schmalhorst_Ennen_Gärner_Frese_Jakob_et al._2025, title={Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe}, volume={713}, DOI={10.1016/j.apsusc.2025.164356}, number={164356}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Wortmann, Martin and Bednarz, Beatrice and Nezafat, Negin Beryani and Viertel, Klaus and Kuschel, Olga and Schmalhorst, Jan and Ennen, Inga and Gärner, Maik and Frese, Natalie and Jakob, Gerhard and et al.}, year={2025} }
Wortmann, Martin, Beatrice Bednarz, Negin Beryani Nezafat, Klaus Viertel, Olga Kuschel, Jan Schmalhorst, Inga Ennen, et al. “Oxidation State Depth Profiling by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” Applied Surface Science 713 (2025). https://doi.org/10.1016/j.apsusc.2025.164356.
M. Wortmann et al., “Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe,” Applied Surface Science, vol. 713, 2025.
Wortmann, Martin, et al. “Oxidation State Depth Profiling by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” Applied Surface Science, vol. 713, 164356, Elsevier BV, 2025, doi:10.1016/j.apsusc.2025.164356.
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