Metric-Based Few-Shot Learning for Pollen Grain Image Classification
P. Viertel, M. König, J. Rexilius, in: M. De Marsico, G. Sanniti di Baja, A. Fred (Eds.), Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, 2023, pp. 418–425.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Herausgeber*in
De Marsico, Maria ;
Sanniti di Baja, Gabriella ;
Fred , Ana
Einrichtung
Erscheinungsjahr
Titel des Konferenzbandes
Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM
Seite
418-425
Konferenz
12th International Conference on Pattern Recognition Applications and Methods
Konferenzort
Lisbon, Portugal
Konferenzdatum
2023-02-22 – 2023-02-24
ISBN
FH-PUB-ID
Zitieren
Viertel, Philipp ; König, Matthias ; Rexilius, Jan: Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In: De Marsico, M. ; Sanniti di Baja, G. ; Fred , A. (Hrsg.): Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, 2023, S. 418–425
Viertel P, König M, Rexilius J. Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In: De Marsico M, Sanniti di Baja G, Fred A, eds. Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM. ; 2023:418-425. doi:10.5220/0011727900003411
Viertel, P., König, M., & Rexilius, J. (2023). Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In M. De Marsico, G. Sanniti di Baja, & A. Fred (Eds.), Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM (pp. 418–425). Lisbon, Portugal. https://doi.org/10.5220/0011727900003411
@inproceedings{Viertel_König_Rexilius_2023, title={Metric-Based Few-Shot Learning for Pollen Grain Image Classification}, DOI={10.5220/0011727900003411}, booktitle={Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM}, author={Viertel, Philipp and König, Matthias and Rexilius, Jan}, editor={De Marsico, Maria and Sanniti di Baja, Gabriella and Fred , AnaEditors}, year={2023}, pages={418–425} }
Viertel, Philipp, Matthias König, and Jan Rexilius. “Metric-Based Few-Shot Learning for Pollen Grain Image Classification.” In Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, edited by Maria De Marsico, Gabriella Sanniti di Baja, and Ana Fred , 418–25, 2023. https://doi.org/10.5220/0011727900003411.
P. Viertel, M. König, and J. Rexilius, “Metric-Based Few-Shot Learning for Pollen Grain Image Classification,” in Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, Lisbon, Portugal, 2023, pp. 418–425.
Viertel, Philipp, et al. “Metric-Based Few-Shot Learning for Pollen Grain Image Classification.” Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, edited by Maria De Marsico et al., 2023, pp. 418–25, doi:10.5220/0011727900003411.
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