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1 Publikation


2011 | Artikel | FH-PUB-ID: 6009
K. Büchner, N. Ehrhardt, B. Cahill, and C. Hoffmann, “Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide,” Thin Solid Films, vol. 519, no. 19, pp. 6480–6485, 2011.
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Zitationsstil: IEEE

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