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2011 | Artikel | FH-PUB-ID: 6009
Büchner K, Ehrhardt N, Cahill B, Hoffmann C. Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide. Thin Solid Films. 2011;519(19):6480-6485. doi:10.1016/j.tsf.2011.04.215
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