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1 Publikation
2011 | Artikel | FH-PUB-ID: 6009
Büchner, Kerstin ; Ehrhardt, Nadja ; Cahill, Brian ; Hoffmann, Christian: Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide. In: Thin Solid Films Bd. 519, Elsevier BV (2011), Nr. 19, S. 6480–6485
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