Reliability Assessment in Approximate Accelerator Synthesis
S. Sadeghi-Kohan, M. Awais, Q.A. Ahmed, M. Platzner, S. Hellebrand, T. Jungeblut, H.-J. Wunderlich, in: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), IEEE, 2026, pp. 1–5.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Sadeghi-Kohan, Somayeh;
Awais, Muhammad;
Ahmed, Qazi Arbab
;
Platzner, Marco;
Hellebrand, Sybille;
Jungeblut, Thorsten ;
Wunderlich, Hans-Joachim
;
Platzner, Marco;
Hellebrand, Sybille;
Jungeblut, Thorsten ;
Wunderlich, Hans-JoachimErscheinungsjahr
Titel des Konferenzbandes
2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Seite
1-5
Konferenz
2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Konferenzort
Bratislava, Slovakia
FH-PUB-ID
Zitieren
Sadeghi-Kohan, Somayeh ; Awais, Muhammad ; Ahmed, Qazi Arbab ; Platzner, Marco ; Hellebrand, Sybille ; Jungeblut, Thorsten ; Wunderlich, Hans-Joachim: Reliability Assessment in Approximate Accelerator Synthesis. In: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) : IEEE, 2026, S. 1–5
Sadeghi-Kohan S, Awais M, Ahmed QA, et al. Reliability Assessment in Approximate Accelerator Synthesis. In: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE; 2026:1-5. doi:10.1109/DDECS69233.2026.11520985
Sadeghi-Kohan, S., Awais, M., Ahmed, Q. A., Platzner, M., Hellebrand, S., Jungeblut, T., & Wunderlich, H.-J. (2026). Reliability Assessment in Approximate Accelerator Synthesis. In 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (pp. 1–5). Bratislava, Slovakia: IEEE. https://doi.org/10.1109/DDECS69233.2026.11520985
@inproceedings{Sadeghi-Kohan_Awais_Ahmed_Platzner_Hellebrand_Jungeblut_Wunderlich_2026, title={Reliability Assessment in Approximate Accelerator Synthesis}, DOI={10.1109/DDECS69233.2026.11520985}, booktitle={2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Awais, Muhammad and Ahmed, Qazi Arbab and Platzner, Marco and Hellebrand, Sybille and Jungeblut, Thorsten and Wunderlich, Hans-Joachim}, year={2026}, pages={1–5} }
Sadeghi-Kohan, Somayeh, Muhammad Awais, Qazi Arbab Ahmed, Marco Platzner, Sybille Hellebrand, Thorsten Jungeblut, and Hans-Joachim Wunderlich. “Reliability Assessment in Approximate Accelerator Synthesis.” In 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 1–5. IEEE, 2026. https://doi.org/10.1109/DDECS69233.2026.11520985.
S. Sadeghi-Kohan et al., “Reliability Assessment in Approximate Accelerator Synthesis,” in 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Bratislava, Slovakia, 2026, pp. 1–5.
Sadeghi-Kohan, Somayeh, et al. “Reliability Assessment in Approximate Accelerator Synthesis.” 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), IEEE, 2026, pp. 1–5, doi:10.1109/DDECS69233.2026.11520985.
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