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1 Publikation
2024 | Artikel | FH-PUB-ID: 4571 | 
Wortmann, Martin ; Viertel, Klaus ; Westphal, Michael ; Graulich, Dominik ; Yang, Yang ; Gärner, Maik ; Schmalhorst, Jan ; Frese, Natalie ; u. a.: Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. In: Small Methods Bd. 8, Wiley (2024), Nr. 3
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