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1 Publikation
2024 | Artikel | FH-PUB-ID: 4571 | 
Wortmann, M., Viertel, K., Westphal, M., Graulich, D., Yang, Y., Gärner, M., … Kuschel, T. (2024). Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. Small Methods, 8(3). https://doi.org/10.1002/smtd.202300944
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