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2024 | Artikel | FH-PUB-ID: 4571 | OA
Wortmann M, Viertel K, Westphal M, et al. Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. Small Methods. 2024;8(3). doi:10.1002/smtd.202300944
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