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1 Publikation
2024 | Artikel | FH-PUB-ID: 4571 | 
Wortmann, Martin, et al. “Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.” Small Methods, vol. 8, no. 3, Wiley, 2024, doi:10.1002/smtd.202300944.
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